Join our innovative Dual Beam Analysis team, where you'll work with state-of-the-art microscopy tools to support imaging and materials analysis of client samples. We're seeking a skilled Scientist with expertise in Dual Beam FIB/SEM technology to play a critical role in advanced microscopy investigations. In this role, you'll prepare high-quality TEM lamella, perform SEM imaging and EDS analysis on FIB cross-sections to support detailed structural, compositional, and failure analysis for clients across diverse industries. You'll also contribute to critical dimension (CD) measurements, process optimization, and work closely with cross-functional teams to deliver timely analytical results for a wide range of semiconductor and materials characterization projects. The ideal candidate is a strong technical contributor who enjoys working directly with advanced tools, thrives in a collaborative, fast-paced laboratory environment, and takes pride in delivering results for clients.What You'll Do:Support FIB/SEM operation, including TEM lamella preparation and FIB-SEM/EDS analysis.Develop and implement automation workflows on Dual Beam (FIB/SEM) systems for lamella prep, cross-sectioning, and imaging.Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.Perform image processing and analysis on 2D/3D FIB/SEM datasets.Improve throughput, repeatability, and data quality of Dual Beam services.Collaborate with cross-functional teams to solve failure analysis and materials characterization challenges.Engage with a diverse customer base across multiple industries, providing technical consultation and guidance on analytical approaches and solutions.Work Schedule: 5pm-2am, Tuesdays to Saturdays (Shift differential will apply)
